Dangerous Effects Induced on Power MOSFETs by Terrestrial Neutrons
- Autori: Consentino, G; Laudani, A; Privitera, G; Pace, C; Giordano, C; Mazzeo, M; Hernandez-Ambato, JL; Parlato, A; Marchese, N; Tomarchio, EA
- Anno di pubblicazione: 2013
- Tipologia: eedings
- OA Link: http://hdl.handle.net/10447/98196
Abstract
This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when they are biased during their normal working conditions especially in inverters for photovoltaic applications. After a brief review of power MOSFETs failure phenomena caused by neutron irradiation (with emphasis on so called “Single Event Effects” (SEE)), the results of an accelerated test performed with the Am-Be source at the University of Palermo are discussed.