ENERGY DISPERSIVE X-RAY DIFFRACTION POTENTIALITY IN THE FIELD OF CULTURAL HERITAGE: SIMULTANEOUS STRUCTURAL AND ELEMENTAL ANALYSIS OF VARIOUS ARTEFACTS.
- Autori: Caponetti, E.; Caminiti, R.; CHILLURA MARTINO, D.; Saladino, M.
- Anno di pubblicazione: 2007
- Tipologia: Articolo in rivista (Articolo in rivista)
- OA Link: http://hdl.handle.net/10447/20174
The applicability of an Energy Dispersive X-ray Diffractometer to some technical questions in the field of Cultural Heritage is presented. This diffractometer, equipped with a white source, has been utilized for the structural and elemental analysis of some items having different nature. Given its design, the instrument allows to collect data from samples as big as a book or a little more. Samples, without collection of any portion and without any preliminary preparation, have been placed in the instrument and spectra have been collected in a wide energy range that contains X-ray fluorescence and diffraction features. In all cases, data acquired in air and in a non destructive way were reliable and their collection was fast. Fluorescence and X-ray diffraction information, when possible, have been compared with those obtained by XRF micro-analysis and by an Angle Dispersive X-ray Diffractometer equipped with a Cu X-ray source. By using the last two techniques, data have been collected from small areas of the samples.