Z-Scan theory for thin film measurements: Validation of a model beyond the standard approach using ITO and HfO2

Abstract

The Z-Scan technique is an easy and widespread approach to evaluate the nonlinear optical coefficient of materials. However, the evaluation of the same coefficients for thin films requires complex experimental setups that allow to remove the contributions of the substrate. Here, we propose a simple, yet effective, theoretical approach that allows to include the substrate contribution to the focusing effect when scanning along the propagation axis. The proposed method therefore removes the need of complex experimental setups and paves the way for a simpler retrieval of optical properties of complex nanostructures.