Photoelectrochemical and XPS characterisation of oxide layers on 316L stainless steel grown in high-temperature water
- Autori: Santamaria, M.; DI FRANCO, F.; DI QUARTO, F.; Pisarek, M.; Zanna, S.; Marcus, P.
- Anno di pubblicazione: 2015
- Tipologia: Articolo in rivista (Articolo in rivista)
- Parole Chiave: Photocurrent spectroscopy; Pressurised water reactor; Stainless steel; XPS; Electrochemistry; Electrical and Electronic Engineering; Condensed Matter Physics; Materials Science (all)
- OA Link: http://hdl.handle.net/10447/154263
Passive films on AISI 316L stainless steel were grown by exposure in high temperature (300 °C and 150 bar) water. X-ray photoelectron spectroscopy was employed to study their composition as a function of immersion time. A photoelectrochemical investigation, supported by electrochemical and impedance measurements, allowed to get information on the solid-state properties of the investigated layers. The experimental results suggest the formation of a stratified layer with an outer iron-rich layer and an inner Cr-rich oxide layer, whose relative thickness and composition are dependent on the immersion time.