Defects in III-N LEDs: experimental identification and impact on electro-optical characteristics
- Authors: Buffolo M.; Roccato N.; Piva F.; De Santi C.; Brescancin R.; Casu C.; Caria A.; Mukherjee K.; Haller C.; Carlin J.F.; Grandjean N.; Vallone M.; Tibaldi A.; Bertazzi F.; Goano M.; Verzellesi G.; Mosca M.; Meneghesso G.; Zanoni E.; Meneghini M.
- Publication year: 2022
- Type: Contributo in atti di convegno pubblicato in volume
- OA Link: http://hdl.handle.net/10447/593621
Abstract
III-N light-emitting-diodes (LEDs) are subject of intense investigations, thanks to their high efficiency and great reliability. The quality of the semiconductor material has a significant impact on the electro-optical performance of LEDs: for this reason, a detailed characterization of defect properties and the modeling of the impact of defects on device performance are of fundamental importance. This presentation addresses this issue, by discussing a set of recent case studies on the topic; specifically, we focus on the experimental characterization of defects, and on the modeling of their impact on the electro-optical characteristics of the devices.