Role of H2O in the thermal annealing of the E’_gamma center in amorphous silicon dioxide
- Authors: NUCCIO L; AGNELLO S; BOSCAINO R
- Publication year: 2009
- Type: Articolo in rivista (Articolo in rivista)
- Key words: sistemi amorfi, difetti di punto
- OA Link: http://hdl.handle.net/10447/36103