Variability of the Si–O–Si angle in amorphous-SiO2 probed by electron paramagnetic resonance and Raman spectroscopy
- Authors: Buscarino, G; Vaccaro, G; Agnello, S; Gelardi, FM
- Publication year: 2009
- Type: Articolo in rivista (Articolo in rivista)
- Key words: Raman scattering, Microwave Radiation effects, Magnetic properties, Raman spectroscopy, Silica, Radiation, Electron spin resonance, Defects
- OA Link: http://hdl.handle.net/10447/44521