Ge-doping dependence of gamma-ray induced germanium lone pair centers in Ge-doped silica
- Authors: ALESSI A; AGNELLO S; GELARDI FM; BOSCAINO R
- Publication year: 2008
- Type: Articolo in rivista (Articolo in rivista)
- Key words: sistemi amorfi, difetti di punto
- OA Link: http://hdl.handle.net/10447/39336