Custom measurement system for memristor characterisation
- Authors: Lupo, F.V.; Scirè, D.; Mosca, M.; Crupi, I.; Razzari, L.; Macaluso, R.
- Publication year: 2021
- Type: Articolo in rivista
- OA Link: http://hdl.handle.net/10447/514276
Abstract
A cheap, compact and customisable characterisation system for memristor devices, working between ±10 V, is presented. SPICE (Simulation Program with Integrated Circuit Emphasis) simulations are performed to verify the circuit feasibility and a proper software is developed to drive the system. The potentiality of the realised system is tested by performing several electrical measurements on both Cu/HfO2/Pt memristors and two-terminals commercial devices.