EPR on Radiation-Induced Defects in SiO2
- Autori: Alessi A; Agnello S; Buscarino G; Pan Y; Mashkovtsev RI
- Anno di pubblicazione: 2014
- Tipologia: Capitolo o Saggio (Capitolo o saggio)
- OA Link: http://hdl.handle.net/10447/105689
Abstract
Continuous-wave electron paramagnetic resonance (EPR) spectroscopy has been the technique of choice for the studies of radiation-induced defects in silica (SiO2) for 60 years, and has recently been expanded to include more sophisticated techniques such as high-frequency EPR, pulse electron nuclear double resonance (ENDOR), and pulse electron spin echo envelope modulation (ESEEM) spectroscopy. Structural models of radiation-induced defects obtained from single-crystal EPR analyses of crystalline SiO2 (alfa-quartz) are often applicable to their respective analogues in amorphous silica (a-SiO2), although significant differences are common.