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ALESSANDRO BUSACCA

High resolution x-ray investigation of periodically poled lithium tantalate crystals with short periodicity

  • Authors: Bazzan, M; Sada, C; Argiolas, N; Busacca, A; Oliveri, RL; Stivala, S; Curcio, L; Riva Sanseverino, S
  • Publication year: 2009
  • Type: Articolo in rivista (Articolo in rivista)
  • Key words: Dielectric polarisation; Electric domain walls; Ferroelectric materials; Lanthanum compounds; X-ray diffraction; Domain structure; Hysteresis; Polarization and depolarization.
  • OA Link: http://hdl.handle.net/10447/46085

Abstract

Domain engineering technology in lithium tantalate is a well studied approach for nonlinear optical applications. However, for several cases of interest, the realization of short period structures (<2 μm) is required, which make their characterization difficult with standard techniques. In this work, we show that high resolution x-ray diffraction is a convenient approach for the characterization of such structures, allowing us to obtain in a nondestructive fashion information such as the average domain period, the domain wall inclination, and the overall structure quality.