TOTAL INTERNAL REFLECTION ELLIPSOMETRY FOR THE SPECTROSCOPIC INVESTIGATION OF ULTRATHIN SILVER/OXIDE FILMS
- Authors: Zola, D; Grilli, MLA; Piegari, A; Sytchkova, A; Giambra, M; Parisi, A; Busacca, A; Fang, M; He, H; Shao, J
- Publication year: 2013
- Type: eedings
- OA Link: http://hdl.handle.net/10447/104815